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  • Intellitech Corporation  - Manufacturer of components that are used to inspect integrated circuits. Also has an array of available tools capable of test scanning printed circuit boards.
  • LogicVision  - Testing services using nanometer to observe semiconductor devices. Also has desktop silicon characterization and related diagnostics solution to examine device failures.
  • Project DILDIS: Design for Testability  - Overview of the experiment conducted to determine errors and physical faults of any material by using simulation technology and other diagnostics.
  • Ridgetop Group  - Packaged products provided to determine faults including verification monitor, electronic prognostics and balance simulator. Specifies the technical details of the equipment.
  • VLSI Testing and Design for Testability Research  - Conducted study at the University of Texas that explores new methods of quality inspection for large structures through high-level simulation models. Indicates the topics covered.
 
 
 
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